International Business Machines Corporation
Vertically stacked fin semiconductor devices
Last updated:
Abstract:
Semiconductor devices and methods of forming the same include forming a first dielectric layer around a semiconductor fin, formed from a first dielectric material, to a target height lower than a height of the semiconductor fin. A second dielectric layer is deposited on the first dielectric layer and is formed from a second dielectric material. A third dielectric layer, formed from the first dielectric material, is formed on the second dielectric layer. The second dielectric layer is etched away to expose a gap on the semiconductor fin. A portion of the semiconductor fin that is exposed in the gap is oxidized to form an isolation layer.
Status:
Grant
Type:
Utility
Filling date:
29 Apr 2019
Issue date:
27 Jul 2021