International Business Machines Corporation
Structural enhancement of Cu nanowires

Last updated:

Abstract:

A structure comprising a first dielectric layer embedded with a first interconnect structure. An insulator layer is disposed on the first dielectric layer. A second dielectric layer is disposed on the insulator layer. A via resides within the second dielectric layer. A second interconnect structure is isolated from the first dielectric layer. A first portion of a bottom surface of the via resides on a top surface of the insulator layer. A second portion of the bottom surface of the via resides on a first portion of a top surface of the first interconnect structure.

Status:
Grant
Type:

Utility

Filling date:

2 Jan 2019

Issue date:

6 Jul 2021