Intel Corporation
Metallization structures under a semiconductor device layer
Last updated:
Abstract:
Metallization structures under a semiconductor device layer. A metallization structure in alignment with semiconductor fin may be on a side of the fin opposite a gate stack. Backside and/or frontside substrate processing techniques may be employed to form such metallization structures on a bottom of a semiconductor fin or between bottom portions of two adjacent fins. Such metallization structures may accompany interconnect metallization layers that are over a gate stack, for example to increase metallization layer density for a given number of semiconductor device layers.
Status:
Grant
Type:
Utility
Filling date:
1 Jul 2017
Issue date:
31 Aug 2021