Intel Corporation
Substrate with embedded stacked through-silicon via die
Last updated:
Abstract:
A substrate with an embedded stacked through-silicon via die is described. For example, an apparatus includes a first die and a second die. The second die has one or more through-silicon vias disposed therein (TSV die). The first die is electrically coupled to the TSV die through the one or more through-silicon vias. The apparatus also includes a coreless substrate. Both the first die and the TSV die are embedded in the coreless substrate.
Status:
Grant
Type:
Utility
Filling date:
18 Sep 2019
Issue date:
31 Aug 2021