Intel Corporation
Runtime flip stability characterization

Abstract:

Methods and apparatus relating to techniques for runtime flip stability characterization are described. In an embodiment, logic circuitry determines the amount of work to be performed by a processor to render a pattern during each of a plurality of Vertical blank (Vblank) intervals. Memory stores information corresponding to a workload to be executed by the processor during each of the plurality of Vblank intervals. An operating frequency of the processor may then be modified based at least in part on analysis of the stored information to indicate which of the plurality of Vblank intervals would provide an improved stability for rendering the pattern. Other embodiments are also disclosed and claimed.