Intel Corporation
TECHNIQUES TO MITIGATE ERROR DURING A READ OPERATION TO A MEMORY ARRAY

Last updated:

Abstract:

Examples may include techniques to mitigate errors during a read operation to a memory cell of a memory array. Examples include selecting the memory cell and applying one of multiple demarcation read voltages for respective multiple time intervals to sense a state of a resistive storage element of the memory cell. Examples also include applying a bias voltage to the memory cell following a sense interval to mitigate read disturb to the resistive storage element incurred while the one of the multiple demarcation read voltages was applied to the memory cell.

Status:
Application
Type:

Utility

Filling date:

24 Mar 2020

Issue date:

30 Sep 2021