Intel Corporation
In-band margin probing on an operational interconnect
Last updated:
Abstract:
There is disclosed in an example an interconnect apparatus having: a root circuit; and a downstream circuit comprising at least one receiver; wherein the root circuit is operable to provide a margin test directive to the downstream circuit during a normal operating state; and the downstream circuit is operable to perform a margin test and provide a result report of the margin test to the root circuit. This may be performed in-band, for example in the L0 state. There is also disclosed a system comprising such an interconnect, and a method of performing margin testing.
Status:
Grant
Type:
Utility
Filling date:
29 May 2020
Issue date:
26 Oct 2021