Intel Corporation
Antiferroelectric gate dielectric transistors and their methods of fabrication

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Abstract:

A transistor, including an antiferroelectric (AFE) gate dielectric layer is described. The AFE gate dielectric layer may be crystalline and include oxygen and a dopant. The transistor further includes a gate electrode on the AFE gate dielectric layer, a source structure and a drain structure on the substrate, where the gate electrode is between the source structure and the drain structure. The transistor further includes a source contact coupled with the source structure and a drain contact coupled with the drain structure.

Status:
Grant
Type:

Utility

Filling date:

12 Jan 2018

Issue date:

19 Oct 2021