Intel Corporation
BUILT-IN SELF-TEST FOR NETWORK ON CHIP FABRIC

Abstract:

A system comprising a network-on-chip (NOC) fabric comprising a plurality of routes to communicate data between a plurality of agents; a plurality of built-in self-test (BIST) generators, wherein a BIST generator of the plurality of BIST generators is coupled between an agent of the plurality of agents and the NOC fabric and is to transmit at least one test pattern through the NOC fabric; and a plurality of BIST checkers, wherein a BIST checker of the plurality of BIST checkers is coupled between the agent of the plurality of agents and the NOC fabric and is to receive at least one test pattern through the NOC fabric from at least one of the plurality of BIST generators and to verify whether the at least one test pattern was transmitted correctly through the NOC fabric.