Intel Corporation
Error measurement method using a time-variant stopband test signal

Abstract:

Systems, methods, and circuitries are provided to measure a swept error power ratio (SWEEPR) of a device under test. A method includes generating a time-variant stopband test signal having a time-variant stopband and determining an error of the device under test based on an output signal generated by the device under test in response to the time-variant stopband test signal.