Intel Corporation
ENSEMBLE LEARNING FOR DEEP FEATURE DEFECT DETECTION

Abstract:

An apparatus to facilitate ensemble learning for deep feature defect detection is disclosed. The apparatus includes one or more processors to receive a deep feature vector from a feature extractor of an ensemble learning system, the deep feature vector extracted from input data; cluster the deep feature vector into a plurality of clusters based on a distance into the plurality of clusters; execute a probabilistic machine learning model corresponding to a cluster of the plurality of clusters to which the deep feature vector is clustered; and detect whether the deep feature vector comprises a defect based on an output of execution of the probabilistic machine learning model.