Intel Corporation
MEMORY WORDLINE ISOLATION FOR IMPROVEMENT IN RELIABILITY, AVAILABILITY, AND SCALABILITY (RAS)

Abstract:

A memory device that performs internal ECC (error checking and correction) can treat an N-bit channel as two N/2-bit channels for application of ECC. The memory device includes a memory array to store data and prefetches data bits and error checking and correction (ECC) bits from the memory array for a memory access operation. The memory device includes internal ECC hardware to apply ECC, with a first group of a first half the data bits checked by a first half of the ECC bits in parallel with a second group of a second half of the data bits checked by a second half of the ECC bits.