Intel Corporation
Method of forming stacked trench contacts and structures formed thereby

Last updated:

Abstract:

Methods and associated structures of forming a microelectronic device are described. Those methods may include forming a structure comprising a first contact metal disposed on a source/drain contact of a substrate, and a second contact metal disposed on a top surface of the first contact metal, wherein the second contact metal is disposed within an ILD disposed on a top surface of a metal gate disposed on the substrate.

Status:
Grant
Type:

Utility

Filling date:

5 Aug 2020

Issue date:

17 May 2022