Intel Corporation
CHEVRON INTERCONNECT FOR VERY FINE PITCH PROBING
Last updated:
Abstract:
An apparatus an apparatus comprising: a substrate having a plane; and an array of at least one conductive probe having a base affixed to the substrate, the at least one conductive probe having a major axis extending from the plane of the substrate and terminating at a tip, wherein the one or more conductive probes comprise at least three points that are non-collinear.
Status:
Application
Type:
Utility
Filling date:
22 Feb 2022
Issue date:
9 Jun 2022