Intel Corporation
CHEVRON INTERCONNECT FOR VERY FINE PITCH PROBING

Last updated:

Abstract:

An apparatus an apparatus comprising: a substrate having a plane; and an array of at least one conductive probe having a base affixed to the substrate, the at least one conductive probe having a major axis extending from the plane of the substrate and terminating at a tip, wherein the one or more conductive probes comprise at least three points that are non-collinear.

Status:
Application
Type:

Utility

Filling date:

22 Feb 2022

Issue date:

9 Jun 2022