Intel Corporation
Built-In-Self-Test Circuits And Methods In Sectors Of Integrated Circuits

Abstract:

An integrated circuit includes sectors of logic circuits. Each of the sectors of logic circuits includes a local sector manager controller circuit that provides an indication to perform a memory test. Each of the sectors also includes a built-in-self-test circuit that is configurable to generate a control signal and expected data in response to the indication to perform the memory test. Each of the sectors also includes a memory circuit that outputs read data in response to the control signal during the memory test. Each of the sectors further includes a comparator circuit configurable to compare the read data with the expected data during the memory test to generate a test result that is provided to the built-in-self-test circuit.