Intel Corporation
Engineering tensile strain buffer in art for high quality Ge channel
Last updated:
Abstract:
An apparatus including a transistor device including a channel including germanium disposed on a substrate; a buffer layer disposed on the substrate between the channel and the substrate, wherein the buffer layer includes silicon germanium; and a seed layer disposed on the substrate between the buffer layer and the substrate, wherein the seed layer includes germanium. A method including forming seed layer on a silicon substrate, wherein the seed layer includes germanium; forming a buffer layer on the seed layer, wherein the buffer layer includes silicon germanium; and forming a transistor device including a channel on the buffer layer.
Status:
Grant
Type:
Utility
Filling date:
2 Jul 2016
Issue date:
20 Sep 2022