Intel Corporation
INTEGRATED BRIDGE FOR DIE-TO-DIE INTERCONNECTS

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Abstract:

An electronic device and associated methods are disclosed. In one example, the electronic device can include a semiconductor package including a package substrate, a first semiconductor die on the package substrate, a second semiconductor die on the package substrate, a third semiconductor die on the package substrate, and a bridge interconnect at least partially embedded in the package substrate. The bridge interconnect can include a first bridge section coupling the first semiconductor die to the second semiconductor die, a second bridge section coupling the second semiconductor die to the third semiconductor die, and a power-ground section between the first section and the second section, the power-ground section comprising first and second conductive traces coupled to the second semiconductor die.

Status:
Application
Type:

Utility

Filling date:

18 Sep 2020

Issue date:

24 Jun 2021