Keysight Technologies, Inc.
MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL MEASUREMENT DEVICE

Abstract:

A method and system measure a characteristic of a signal under test (SUT) using a signal measurement device. The method includes receiving and digitizing the first and second copies of the SUT through first and second input channels to obtain first and second digitized waveforms; repeatedly determining measurement values of the SUT characteristic in the first and second digitized waveforms to obtain first and second measurement values, which are paired in measurement value pairs; multiplying the first and second measurement values in each of the measurement value pairs to obtain measurement products; determining an average value of the measurement products to obtain an MSV of the measured SUT characteristic; and determine a square root of the MSV to obtain an RMS value of the measured SUT characteristic. The RMS value substantially omits variations not in the SUT, which are introduced by only one of the first and second input channels.