Lattice Semiconductor Corporation
FAILURE CHARACTERIZATION SYSTEMS AND METHODS FOR PROGRAMMABLE LOGIC DEVICES

Abstract:

Systems and methods for failure characterization of secure programmable logic devices (PLDs) are disclosed. An example system includes a secure PLD including programmable logic blocks (PLBs) arranged in PLD fabric of the secure PLD, and a configuration engine configured to program the PLD fabric according to a configuration image stored in non-volatile memory (NVM) of the secure PLD and/or coupled through a configuration input/output (I/O) of the secure PLD. The secure PLD is configured to receive a failure characterization (FC) command from the PLD fabric or an external system coupled to the secure PLD through the configuration I/O, and to execute the FC command to, at least in part, erase and/or nullify portions of the NVM. The secure PLD may also be configured to boot a debug configuration for the PLD fabric that identifies and/or characterizes operational failures of the secure PLD.