Lattice Semiconductor Corporation
Deterministic read back and error detection for programmable logic devices

Abstract:

Various techniques are provided to efficiently implement deterministic read back and error detection for programmable logic devices (PLDs). In one example, a PLD includes an array of memory cells arranged in rows and columns, where at least one row includes an enable bit. The PLD further includes an address logic circuit configured to selectively assert the columns of the array by respective address lines. The PLD further includes a register configured to store a value of the enable bit in response to an assertion of an address line corresponding to the enable bit. The PLD further includes a read back circuit configured to selectively provide, for each memory cell, a data bit value stored by the memory cell or a predetermined data bit value based at least on the stored value of the register. Additional systems and related methods are provided.