Everspin Technologies, Inc.
Determining bias configuration for write operations in memory to improve device performance during normal operation as well as to improve the effectiveness of testing routines

Abstract:

Techniques and circuits for testing and configuring bias voltage or bias current for write operations in memory devices are presented. Registers and nonvolatile storage is included on the memory devices for storing values used to control testing of the memory devices as well as for configuring parameters related to both testing and normal operation.