Micron Technology, Inc.
Memory array with access line control having a shunt sense line

Abstract:

An example apparatus includes an array of memory cells. Each memory cell includes an access device. Each access device includes a first source/drain region, a second source/drain region, and a gate opposing a channel connecting the first source/drain region and the second source/drain region. Each access device further includes a storage node. The example apparatus further includes a plurality of sense lines coupled to the first source/drain region of a different respective memory cell of the array of memory cells. The example apparatus further includes a plurality of access lines, wherein each access line includes at least one conductive pathway formed between the access line and a source/drain region of an access device coupled to the access line. The example apparatus further includes a shunt sense line coupled to the additional access device where the conductive pathway is formed.