Micron Technology, Inc.
MEMORY DEVICE WITH ANALOG MEASUREMENT MODE FEATURES

Abstract:

The present disclosure relates to apparatuses and methods for memory management and more particularly to a memory device structured with internal analogic measurement mode features. The memory is provided with means for detecting a correct generation of voltage and/or current reference values in the memory device including at least a memory array and a memory controller. The method provides for a JTAG interface in the memory controller and an analogic measurement block in said memory device driven by said JTAG interface.