Micron Technology, Inc.
IMPROVED SAFETY AND CORRECTNESS DATA READING IN NON-VOLATILE MEMORY DEVICES

Abstract:

The present disclosure includes systems, apparatus, and methods for improving safety and correctness of data reading in flash memory devices associated with System-on-Chips. An example may include a plurality of sub-arrays, a plurality of memory blocks in each sub-array of the plurality of sub-arrays, a plurality of memory rows in each memory block of the plurality of memory blocks, and a plurality of extended pales in each memory row of the plurality of memory rows, wherein each extended page of the plurality of extended pages includes a group of data, an address, and an error correction code (ECC).