Micron Technology, Inc.
MEMORY DEVICE HAVING A SECURE TEST MODE ENTRY

Abstract:

The present disclosure relates to a memory device comprising: an array of memory cells; and an access management architecture providing a secure access to a test mode of the array of memory cells, the access management architecture comprising: a register group comprising data identifying the memory device; a cryptographic algorithm calculating an internal signature having a mechanism for ensuring data freshness; a non volatile memory area storing specific data to be used by the cryptographic algorithm for calculating the internal signature; a comparison block for comparing the calculated internal signature with a user provided signature to generate an enable signal allowing access to a test mode of the array of memory cells. The disclosure also relates to a System-on-Chip (SoC) component comprising a memory device as well as to a method for managing access to a memory array into a test mode.