Micron Technology, Inc.
Selective sampling of a data unit based on program/erase execution time

Abstract:

A processing device, operatively coupled with the memory device, is configured to perform an operation on a page of a plurality of pages of a data unit of the memory device to modify data on the page. The processing device also determines a first operation execution time of the page upon performing the operation on the page of the data unit. The processing device further determines whether the first operation execution time satisfies a condition that is based on a predetermined second operation execution time, the predetermined second operation execution time is indicative of lack of defect in at least one other data unit. Lastly, responsive to determining that the first operation execution time satisfies the condition, the processing device performs a scan operation of at least a subset of the plurality of pages of the data unit to decide whether the data unit has a defect.