Micron Technology, Inc.
METHODS OF FORMING ELECTRONIC DEVICES USING MATERIALS REMOVABLE AT DIFFERENT TEMPERATURES

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Abstract:

A method comprising forming a stack precursor comprising alternating first materials and second materials, the first materials and the second materials exhibit different melting points. A portion of the alternating first materials and second materials is removed to form a pillar opening through the alternating first materials and second materials. A sacrificial material is formed in the pillar opening. The first materials are removed to form first spaces between the second materials, the first materials formulated to be in a liquid phase or in a gas phase at a first removal temperature. A conductive material is formed in the first spaces. The second materials are removed to form second spaces between the conductive materials, the second materials formulated to be in a liquid phase or in a gas phase at a second removal temperature. A dielectric material is formed in the second spaces. The sacrificial material is removed from the pillar opening and cell materials are formed in the pillar opening.

Status:
Application
Type:

Utility

Filling date:

29 May 2020

Issue date:

2 Dec 2021