Micron Technology, Inc.
CHANGING OF MEMORY COMPONENTS TO BE USED FOR A STRIPE BASED ON AN ENDURANCE CONDITION

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Abstract:

A system includes dice and a processing device operatively coupled to the dice. The processing device to perform operations including: storing data of one or more stripes at a first group of dice; determining that the first group of dice has satisfied an endurance condition threshold comprising a predetermined number of write operations or bit errors; changing the endurance condition threshold to a changed endurance condition threshold, wherein the changed endurance condition threshold is based on a number of the first group of dice to come within a threshold percentage of satisfying the endurance condition threshold; and using the changed endurance condition threshold to determine a time to store data of one or more subsequent stripes at a second group of dice, wherein the second group of dice includes at least one die that is not included in the first group of dice.

Status:
Application
Type:

Utility

Filling date:

16 Aug 2021

Issue date:

2 Dec 2021