Micron Technology, Inc.
Memory with per pin input/output termination and driver impedance calibration

Abstract:

Memory devices and systems with per pin input/output termination and driver impedance calibration capabilities, and associated methods, are disclosed herein. In one embodiment, a device apparatus includes circuitry dedicated to an individual DQ pin of the device apparatus. The circuitry can be configured to (i) generate, at least in part, a voltage at the DQ pin based, at least in part, on an impedance internal to a host device electrically connected to the device apparatus and (ii) compare the voltage to a target voltage. Based, at least in part, on the comparison, the circuitry can be configured to adjust a resistance of an output driver and/or a termination circuit of the device apparatus that correspond to the DQ pin to adjust the impedance of the output driver and/or termination circuit to match an impedance associated with a corresponding input/output pin of the host device.