Micron Technology, Inc.
Selectively squelching differential strobe input signal in memory-device testing system

Abstract:

In an embodiment, a differential strobe input squelch circuit includes a squelch sub-circuit that is configured to perform operations including receiving a true strobe signal, a complement strobe signal, and a strobe difference signal that is representative of a difference between the true strobe signal and the complement strobe signal; determining, based on the true strobe signal and the complement strobe signal, whether the strobe difference signal is defined or undefined; and outputting a modified strobe difference signal that is equal to the strobe difference signal when the squelch sub-circuit determines that the strobe difference signal is defined and that is instead equal to a constant strobe-level voltage when the squelch sub-circuit determines that the strobe difference signal is undefined.