Micron Technology, Inc.
Integrated Circuitry, A Method Used In Forming Integrated Circuitry, And A Method Used In Forming A Memory Array Comprising Strings Of Memory Cells
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Abstract:
A method used in forming integrated circuitry comprises forming a stack comprising vertically-alternating first tiers and second tiers. The first tiers comprise doped silicon dioxide and the second tiers comprise undoped silicon dioxide. Horizontally-elongated trenches are formed into the stack. Through the trenches, the doped silicon dioxide that is in the first tiers is etched selectively relative to the undoped silicon dioxide that is in the second tiers. Conducting material is formed in the void space in the first tiers that is left by the etching. Structure independent of method is disclosed.
Status:
Application
Type:
Utility
Filling date:
16 Jul 2020
Issue date:
20 Jan 2022