Micron Technology, Inc.
Reliability health prediction by high-stress seasoning of memory devices

Abstract:

An accelerated seasoning cycle criterion is associated with a memory die of a number of memory dies. The memory die is subjected to one or more accelerated seasoning conditions during accelerated seasoning cycles. Responsive to determining that the accelerated seasoning cycle criterion has been satisfied, a defect scan is performed on the memory die. The memory die is associated with a respective reliability bin of a plurality of reliability bins in view of a result of the defect scan, wherein the result of the defect scan satisfies one or more predetermined threshold reliability criteria corresponding to the respective reliability bin.