Micron Technology, Inc.
Defect detection for a memory device

Abstract:

Methods, systems, and devices for defect detection for a memory device are described. A segmented digital die defect detector may include multiple signal lines, each coupled with a test circuit, and a control circuit to form a path. At least part of the path may extend through an internal portion of the die. A test circuit may generate a digital feedback signal that indicates a condition of a respective signal line. The control circuit may generate a single output signal, indicative of the condition of the signal lines. By utilizing digital testing circuitry and a single digital output signal, a layout area of the segmented digital die defect detector may be reduced and a power consumption associated with the testing operation may be reduced.