Micron Technology, Inc.
Adjustment of a pre-read operation based on an operating temperature

Abstract:

First data can be received at a memory sub-system. An operating temperature of the memory sub-system can be identified. An adjusted read voltage level can be determined in response to the operating temperature satisfying a threshold criterion pertaining to a threshold temperature. A read operation can be performed at the memory sub-system based on the adjusted read voltage level to retrieve second data. The first data can be stored at the memory sub-system based on the second data that was retrieved from the read operation that is based on the adjusted read voltage level.