Micron Technology, Inc.
DETERMINATION OF STATE METRICS OF MEMORY SUB-SYSTEMS FOLLOWING POWER EVENTS

Abstract:

Disclosed is a system including a memory device having a plurality of physical cells and a processing device, operatively coupled with the memory device, to perform operations that include selecting, responsive to detecting a power event, a subset of a plurality of memory cells of the memory device, the memory device being characterized by auxiliary read metadata identifying one or more read offsets for each of the plurality of memory cells, the one or more read offsets representing corrections to read signals applied to the respective memory cell during a read operation. The operations further include performing one or more diagnostic read operations for each of the subset of the plurality of memory cells of the memory device and modifying the auxiliary read metadata by updating the one or more read offsets for at least some of the plurality of memory cells of the memory device.