Micron Technology, Inc.
MANAGEMENT OF PEAK CURRENT OF MEMORY DIES IN A MEMORY SUB-SYSTEM

Last updated:

Abstract:

A portion of a memory management operation associated with a first current level that satisfies a condition pertaining to a threshold current level and a second current level that satisfies the condition pertaining to the threshold current level is identified. Mask data associated with the portion of the memory management operation is identified. Based on the mask data, a current management action is performed during execution of a requested memory management operation received from a host system.

Status:
Application
Type:

Utility

Filling date:

27 Dec 2021

Issue date:

21 Apr 2022