Micron Technology, Inc.
Semiconductor structure formation

Last updated:

Abstract:

An example method includes patterning a working surface of a semiconductor wafer. The example method includes performing a first deposition of a dielectric material in high aspect ratio trenches. The example method further includes performing a high pressure, high temperature vapor etch to recess the dielectric material in the trenches and performing a second deposition of the dielectric material to continue filling the trenches.

Status:
Grant
Type:

Utility

Filling date:

23 Aug 2019

Issue date:

3 May 2022