Micron Technology, Inc.
Semiconductor structure formation
Last updated:
Abstract:
An example method includes patterning a working surface of a semiconductor wafer. The example method includes performing a first deposition of a dielectric material in high aspect ratio trenches. The example method further includes performing a high pressure, high temperature vapor etch to recess the dielectric material in the trenches and performing a second deposition of the dielectric material to continue filling the trenches.
Status:
Grant
Type:
Utility
Filling date:
23 Aug 2019
Issue date:
3 May 2022