Micron Technology, Inc.
MANAGING BIN PLACEMENT FOR BLOCK FAMILIES OF A MEMORY DEVICE USING TRIGGER METRIC SCORES

Abstract:

An example processing device of a memory sub-system is configured to select, from a plurality of voltage bins associated with a memory device, a first set of voltage bins, wherein each voltage bin is associated with a corresponding set of read level offsets; determine, based on a trigger metric associated with the first set of bins, a first score of the first set of bins; replace at least a first voltage bin of the first set with at least a second voltage bin of the plurality of voltage bins to generate a second set of voltage bins; determine a second score of the second set of voltage bins; and responsive to determining that the second score of the second set of bins is greater than the first score of the first set of voltage bins, utilize the second set of voltage bins for performing read operations of the memory device.