Micron Technology, Inc.
VOLTAGE OFFSET BIN SELECTION BY DIE GROUP FOR MEMORY DEVICES
Last updated:
Abstract:
One or more data units at a memory device and that are associated with one or more dice of a die group comprising a plurality of dice are programmed. A voltage offset bin associated with the plurality of dice in the die group is determined based on a subset of dice of the die group.
Status:
Application
Type:
Utility
Filling date:
31 Jan 2022
Issue date:
19 May 2022