Micron Technology, Inc.
VOLTAGE OFFSET BIN SELECTION BY DIE GROUP FOR MEMORY DEVICES

Last updated:

Abstract:

One or more data units at a memory device and that are associated with one or more dice of a die group comprising a plurality of dice are programmed. A voltage offset bin associated with the plurality of dice in the die group is determined based on a subset of dice of the die group.

Status:
Application
Type:

Utility

Filling date:

31 Jan 2022

Issue date:

19 May 2022