Micron Technology, Inc.
DETECTING FAILURE OF A THERMAL SENSOR IN A MEMORY DEVICE

Abstract:

Respective values of a subset of the plurality of memory cells of a memory device are compared to a pattern of pre-programmed memory cells. The pattern pre-programmed memory cells comprise representations of values of the pattern of pre-programmed memory cells when a temperature criterion is satisfied. Responsive to determining that at least a threshold number of the respective values of the subset matches the pattern of pre-programmed memory cells, a temperature reading from a thermal sensor coupled to the memory device is identified. Responsive to determining that the temperature reading does not correspond to a temperature criterion, determining that the thermal sensor has failed.