Micron Technology, Inc.
Separate inter-die connectors for data and error correction information and related systems, methods, and apparatuses

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Abstract:

Separate inter-die connectors for data and error correction information and related systems, methods, and devices are disclosed. An apparatus includes a master die, a target die including data storage elements, inter-die data connectors, and inter-die error correction connectors. The inter-die data connectors electrically couple the master die to the target die. The inter-die data connectors are configured to conduct data between the master die and the target die. The inter-die error correction connectors electrically couple the master die to the target die. The inter-die error correction connectors are separate from the inter-die data connectors. The inter-die error correction connectors are configured to conduct error correction information corresponding to the data between the master die and the target die.

Status:
Grant
Type:

Utility

Filling date:

16 Mar 2020

Issue date:

21 Jun 2022