Micron Technology, Inc.
TEST DEVICES HAVING PARALLEL IMPEDANCES TO REDUCE MEASUREMENT INPUT IMPEDANCE AND RELATED APPARATUSES, SYSTEMS, AND METHODS

Abstract:

Systems, apparatuses, and methods for test devices having parallel impedances to reduce measurement input impedance are disclosed. An apparatus includes a test input terminal, a measurement output terminal, a reference voltage potential node, and a parallel resistor. The test input terminal is configured to electrically connect to a signal output terminal of a signal generator. The test input terminal is configured to receive a test signal from the signal generator via the signal output terminal. The measurement output terminal electrically connects to a measurement input terminal of an electrical measurement instrument. The parallel resistor is electrically connected from the measurement output terminal to the reference voltage potential node. A system includes the apparatus and the electrical measurement instrument. A method includes providing a test signal to the test device, verifying the test signal using the electrical measurement instrument, and providing the test signal to a device under test.