Micron Technology, Inc.
Managing defective bitline locations in a bit flipping decoder

Abstract:

Methods, systems, and apparatuses include receiving a codeword stored in a memory device. The codeword has bits from defective bit locations and non-defective bit locations. A syndrome of a current copy of the codeword is determined. Channel information for non-defective bit locations is determined using the current copy of the codeword and the received codeword from the memory device. Energy function values are determined for bits of the codeword using the syndrome of the current copy. Determining the energy function values includes using the channel information for bits in non-defective bit locations and omitting channel information for bits in defective bit locations. One or more bits of the codeword are flipped in response to the energy function values for the one or more bits satisfying a bit flipping criterion. A corrected codeword that results from the flipping of the bits is returned.