Micron Technology, Inc.
MITIGATING READ DISTURB EFFECTS IN MEMORY DEVICES

Abstract:

A total read counter, a plurality of die read counters, and a plurality of block read counters are maintained. Each die read counter is associated with a respective die of a memory device. A value of a block read counter and a value of a die read counter are determined for a specified block. Based on the value of the block read counter, the value of the die read counter, and the value of the total read counter, an estimated number of read events associated with the specified block of the memory device is determined. Responsive to determining that the estimated number of read events satisfies a predefined criterion, a media management operation of one or more pages associated with the specified block is performed.