Micron Technology, Inc.
Voltage bin selection for blocks of a memory device after power up of the memory device

Abstract:

A processing device of a memory sub-system is configured to detect a power on event associated with the memory device; scan one or more blocks of a plurality of blocks of the memory device to determine a corresponding time after program (TAP) associated with each block of the one or more blocks; estimate, based on the corresponding TAP of the each block of the one or more blocks, a duration of a power off state preceding the power on event; and update voltage bin assignments of the plurality of blocks associated with the memory device based on the duration of the power off state.