Micron Technology, Inc.
MODIFYING CONDITIONS FOR MEMORY DEVICE ERROR CORRECTIONS OPERATIONS

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Abstract:

In response to a determination that an error rating condition associated with a memory device is satisfied, a first error correction operation is performed at the memory device to correct one or more first errors associated with a first memory access operation at the memory device. A detection is made that at least one of a state of the memory device has changed from a first state to a second state or a behavior of the memory device has changed from a first behavior level to a second behavior level. The error rating condition is modified in view of the at least one of the second state of the memory device or the second behavior level of the memory device. In response to a determination that the modified error rating condition is satisfied, a second error correction operation is performed at the memory device to correct one or more second errors associated with a second memory access operation performed at the memory device.

Status:
Application
Type:

Utility

Filling date:

16 May 2022

Issue date:

1 Sep 2022