Micron Technology, Inc.
Random telegraph signal noise reduction scheme for semiconductor memories

Last updated:

Abstract:

Embodiments are provided that include a memory device having a memory array including a plurality of access lines and data lines. The memory device further includes a circuit coupled to the plurality of access lines and configured to provide consecutive pulses to a selected one of the plurality of access lines. Each pulse of the consecutive pulses includes a first voltage and a second voltage. The first voltage is greater in magnitude than the second voltage, and the first voltage is applied for a shorter duration than the second voltage.

Status:
Grant
Type:

Utility

Filling date:

2 Dec 2019

Issue date:

4 May 2021