Micron Technology, Inc.
Read level edge find operations in a memory sub-system

Abstract:

A processing device receives a request to locate a first distribution edge at a target bit error rate (BER) of a first programming distribution. The processing device measures a first BER sample of the first programing distribution using a first offset value that is offset from a first center value corresponding to a first read level threshold and a second BER sample using a second offset value that is offset from the first offset value. The processing device determines that the second BER sample exceeds the target BER and the first BER sample does not exceed the target BER. The processing device determines a first location of the first distribution edge by interpolating between the first BER sample and the second BER sample.