Micron Technology, Inc.
PERFORMING ASYNCHRONOUS SCAN OPERATIONS ACROSS MEMORY SUBSYSTEMS
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Abstract:
A first delay value is obtained by a first memory subsystem of a plurality of memory subsystems. The first memory subsystem performs a first scan operation after a first time from a first event for the first memory subsystem. The first time is based on the first delay value. A second memory subsystem of the plurality of memory subsystems performs a second scan operation based upon a second delay value that is different than the first delay value.
Status:
Application
Type:
Utility
Filling date:
15 Jan 2020
Issue date:
15 Jul 2021