Micron Technology, Inc.
APPRATUS AND METHODS FOR DETERMINATION OF CAPACITIVE AND RESISTIVE CHARACTERISTICS OF ACCESS LINES

Abstract:

Apparatus having an array of memory cells and a controller for access of the array of memory cells, wherein the controller is configured to cause the apparatus to determine capacitance and/or resistance values of an access line in response to applying a reference current to the access line, wherein the access line is connected to control gates of memory cells of the array of memory cells.